Cardoon Electronic Circuit Simulator

User’s Manual

• Overview
  • Introduction
  • License
  • News
• Installation
  • Installation on GNU/Linux
  • Installation on MS Windows
  • Generating this documentation
• Usage
  • From the command line
  • Interactive Session
  • Netlist Format
  • Generating this documentation
• Catalogs
  • Analysis Library Catalog
  • Device Library Catalog
  • Global Options and Constants Tables
• Simulation Examples
  • DC Sweep of CMOS Inverter
  • BJT Colpitts Oscillator Transient Analysis
  • Electro-Thermal BJT Test
  • Transmission Line Model AC test
  • Memductor Hysteresis Loop
  • Examples Directory

Developer’s Manual

• Coding conventions
  • General guidelines
  • Documentation
  • Version Numbers
• Testing
  • Manual Testing
  • Systematic Testing
• Implementing a new device model
  • Module documentation
  • Attributes and functions description
  • Internal Terminals, Local References and Terminal Units
  • Temperature Dependence
  • Nonlinear models
  • Operating Point Information
  • Noise current spectral density sources
  • Independent Sources
  • Linear frequency-defined
  • Devices Package Documentation
  • Re-Generating Catalogs
• Internal Circuit Representation Reference
  • UML Class Diagram
  • Modules and classes
• Nodal Analyses Reference
  • Introduction
  • OP/DC Equations
  • AC Formulation
  • Transient Analysis Equations
• Analyses Utility Classes and Functions
  • nodal – Nodal Analysis
  • nodalSP – Nodal Analysis using Scipy sparse matrices
  • fsolve – Nonlinear equation solve functions
  • integration – Integration methods for ODEs
  • sensitivity – Nodal sensitivity analysis
• Simulator Design Considerations
  • Design History
  • Formulation-Independent Circuit Representation
  • Model, netlist variables and sensitivities considerations
  • Efficiency notes for nodal analysis
  • Temperature handling in electrothermal simulations
  • Development Plan (TODO file)
• References

Indices and tables

• Index
• Module Index
• Search Page